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    <title>DSpace Communauté:</title>
    <link>http://archives.univ-biskra.dz/handle/123456789/2166</link>
    <description />
    <pubDate>Sun, 19 Apr 2026 16:27:16 GMT</pubDate>
    <dc:date>2026-04-19T16:27:16Z</dc:date>
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      <title>DSpace Communauté:</title>
      <url>http://archives.univ-biskra.dz:80/retrieve/49066/2.png</url>
      <link>http://archives.univ-biskra.dz/handle/123456789/2166</link>
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    <item>
      <title>Deep traps and temperature effects on the capacitance of p-type Si-doped GaAs Schottky diodes on (2 1 1) and (3 1 1) oriented GaAs substrates</title>
      <link>http://archives.univ-biskra.dz/handle/123456789/7365</link>
      <description>Titre: Deep traps and temperature effects on the capacitance of p-type Si-doped GaAs Schottky diodes on (2 1 1) and (3 1 1) oriented GaAs substrates
Auteur(s): R. Boumaraf; N. Sengouga; R.H. Mari; Af. Meftah; M. Aziz; Dler Jameel; Noor Al Saqri; D. Taylor; M. Henini
Résumé: The SILVACO-TCAD numerical simulator is used to explain the&#xD;
effect of different types of deep levels on the temperature depen-&#xD;
dence of the capacitance of p-type Si-doped GaAs Schottky diodes&#xD;
grown on high index GaAs substrates, namely (3 1 1)A and (2 1 1)A&#xD;
oriented GaAs substrates. For the (3 1 1)A diodes, the measured&#xD;
capacitance–temperature characteristics at different reverse biases&#xD;
show a large peak while the (2 1 1)A devices display a much smaller&#xD;
one. This peak is related to the presence of different types of deep&#xD;
levels in the two structures. These deep levels are characterized by&#xD;
the Deep Level Transient Spectroscopy (DLTS) technique. In the&#xD;
(3 1 1)A structure only majority deep levels (hole deep levels) were&#xD;
observed while both majority and minority deep levels were pres-&#xD;
ent in the (2 1 1)A diodes. The simulation software, which calcu-&#xD;
lates the capacitance–voltage and the capacitance–temperature&#xD;
characteristics in the absence and presence of different types of&#xD;
deep levels, agrees well with the experimentally observed behavior&#xD;
of the capacitance–temperature properties. A further evidence to&#xD;
confirm that deep levels are responsible for the observed phenom-&#xD;
enon is provided by a simulation of the capacitance–temperature&#xD;
characteristics as a function of the ac-signal frequency.</description>
      <pubDate>Thu, 03 Mar 2016 00:00:00 GMT</pubDate>
      <guid isPermaLink="false">http://archives.univ-biskra.dz/handle/123456789/7365</guid>
      <dc:date>2016-03-03T00:00:00Z</dc:date>
    </item>
    <item>
      <title>Modeling the effect of defects on the performance of an n-CdO/p-Si solar cell</title>
      <link>http://archives.univ-biskra.dz/handle/123456789/7364</link>
      <description>Titre: Modeling the effect of defects on the performance of an n-CdO/p-Si solar cell
Auteur(s): S. Chala; N. Sengouga; F. Yakuphanoglu
Résumé: The interest in the study of Cadmium oxide (CdO) for photonic applications has&#xD;
increased significantly because of its promising electrical and optical properties. Real&#xD;
solar cells based on an n-CdO/p-Si heterostructures show poor photovoltaic&#xD;
performance, however. In this work numerical simulation is used to elucidate this poor&#xD;
performance by considering two cases. CdO is firstly considered as a perfect crystalline&#xD;
semiconductor. The second case models CdO as a semiconductor with continuous&#xD;
distribution of defects states in its band gap, similar to an amorphous semiconductor,&#xD;
made of two tail bands (a donor-like and an acceptor-like) and two Gaussian&#xD;
distribution deep level bands (an acceptor-like and a donor-like). Evidently the first&#xD;
case produced results far from reality. In the second case, however, and by adjusting&#xD;
the constituents of the band gap states the open circuit voltage (VOC) and the short&#xD;
circuit current (JSC) were almost perfectly reproduced but not the fill factor (FF) and the&#xD;
conversion efficiency (η). The p-type doping of Silicon adjustment has lead to a better&#xD;
reproduction of the two latter parameters.</description>
      <pubDate>Thu, 03 Mar 2016 00:00:00 GMT</pubDate>
      <guid isPermaLink="false">http://archives.univ-biskra.dz/handle/123456789/7364</guid>
      <dc:date>2016-03-03T00:00:00Z</dc:date>
    </item>
    <item>
      <title>Optimization of Optical Gain in Inx Ga1-xSb/GaSb unstrained quantum well structures</title>
      <link>http://archives.univ-biskra.dz/handle/123456789/7363</link>
      <description>Titre: Optimization of Optical Gain in Inx Ga1-xSb/GaSb unstrained quantum well structures
Auteur(s): Said Dehimi; Aissat Abdelkader; Djamel Haddad; Lakhdar Dehimi
Résumé: n this paper we study the effects of In concentration, temperature, quantum well width and carrier density on optical gain for&#xD;
GaSb/InxGa1-xSb/GaSb untrained quantum well structures. This system was chosen as it is useful in infrared emission, finally, we&#xD;
introduce the optimum structure of quantum well to obtain the maximum optical gain, at room temperature and infrared emission&#xD;
particularly 2.3 (μm), for the use this structure in application of spectroscopic analysis of the gases specially CH4. This structure&#xD;
can be used for light absorption to increase the solar cell efficiency a based on a quantum well and multi-junction.</description>
      <pubDate>Thu, 03 Mar 2016 00:00:00 GMT</pubDate>
      <guid isPermaLink="false">http://archives.univ-biskra.dz/handle/123456789/7363</guid>
      <dc:date>2016-03-03T00:00:00Z</dc:date>
    </item>
    <item>
      <title>SMALL-SIGNAL TIME-DOMAIN PHYSICAL/ELECTRICAL FET MODELING APPROACH</title>
      <link>http://archives.univ-biskra.dz/handle/123456789/7362</link>
      <description>Titre: SMALL-SIGNAL TIME-DOMAIN PHYSICAL/ELECTRICAL FET MODELING APPROACH
Auteur(s): N.A. Abdeslam; S. Asadi; N. Sengouga; M.C.E. Yagoub
Résumé: In this paper, a reliable small-signal time-domain FET&#xD;
modeling approach is proposed. Based on physical/electrical&#xD;
parameters, the proposed model can efficiently characterize&#xD;
high-frequency transistors.</description>
      <pubDate>Thu, 03 Mar 2016 00:00:00 GMT</pubDate>
      <guid isPermaLink="false">http://archives.univ-biskra.dz/handle/123456789/7362</guid>
      <dc:date>2016-03-03T00:00:00Z</dc:date>
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